The 43rd Annual NANO Testing Symposium

The 43rd Annual NANO Testing Symposium

日時:
会場:
Osaka University
主催:
Intelligent Integrated Systems, Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University

The institute of NANO testing invites nano testing professionals at all levels of experience from around the world to submit abstracts to NANOTS2023. NANOTS continues to be one of the leading technical symposiums for discussing solutions that improve the testing process of nano-scale devices and materials. For test designers, device manufacturers, and materials suppliers and testing equipment, NANOTS provides opportunities for testing professionals to network and learn the latest in the practical application of advanced nano testing strategies and methodologies to achieving nano-scale device dependability excellence. The three-day event of the 43rd NANOTS (NANOTS2023) will consist of a symposium with a special invited talk, a special session, technical sessions, a commercial session, an equipment exhibition and an evening session. Papers for a special session and technical sessions are peer-reviewed and are selected based on a clear outline of problem, analysis, solution/results and conclusion.
Presentations on original, non-commercial and non-published works are being solicited in the following technical scope.

お問合せ先:Intelligent Integrated Systems, Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University
TEL: +81-6-6879-7813
FAX: +81-6-6879-7812
E-mail:NANOTS@ist.osaka-u.ac.jp